Learning with Bounded Instance- and Label-dependent Label Noise

Jul 12, 2020

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Instance- and Label-dependent label Noise (ILN) widely exists in real-world datasets but has been rarely studied. In this paper, we focus on Bounded Instance- and Label-dependent label Noise (BILN), a particular case of ILN where the label noise rates—the probabilities that the true labels of examples flip into the corrupted ones—have upper bound less than 1. Specifically, we introduce the concept of distilled examples, i.e. examples whose labels are identical with the labels assigned for them by the Bayes optimal classifier, and prove that under certain conditions classifiers learnt on distilled examples will converge to the Bayes optimal classifier. Inspired by the idea of learning with distilled examples, we then propose a learning algorithm with theoretical guarantees for its robustness to BILN. At last, empirical evaluations on both synthetic and real-world datasets show effectiveness of our algorithm in learning with BILN.

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Über ICML 2020

The International Conference on Machine Learning (ICML) is the premier gathering of professionals dedicated to the advancement of the branch of artificial intelligence known as machine learning. ICML is globally renowned for presenting and publishing cutting-edge research on all aspects of machine learning used in closely related areas like artificial intelligence, statistics and data science, as well as important application areas such as machine vision, computational biology, speech recognition, and robotics. ICML is one of the fastest growing artificial intelligence conferences in the world. Participants at ICML span a wide range of backgrounds, from academic and industrial researchers, to entrepreneurs and engineers, to graduate students and postdocs.

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