A Stein Goodness-of-fit Test for Exponential Random Graph Models

Apr 14, 2021

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We propose and analyze a novel nonparametric goodness-of-fit testing procedure for ex-changeable exponential random graph model (ERGM) when a single network realization is observed. The test determines how likely it is that the observation is generated from a target unnormalized ERGM density. Our test statistics are derived of kernel Stein discrepancy, a divergence constructed via Stein’s method using functions from a reproducing kernel Hilbert space (RKHS), combined with a discrete Stein operator for ERGMs. The test is a Monte Carlo test using simulated networks from the target ERGM. We show theoretical properties for the testing procedure w.r.t a class of ERGM. Simulation studies and real network applications are presented

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The 24th International Conference on Artificial Intelligence and Statistics was held virtually from Tuesday, 13 April 2021 to Thursday, 15 April 2021.

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