Jul 12, 2020
We present a new method for evaluating and training unnormalized density models. Our approach only requires access to the gradient of the unnormalized model’s log-density. We estimate the Stein discrepancy between the data density p(x) and the model density q(x) based on a vector function of the data. We parameterize this function with a neural network and fit its parameters to maximize this discrepancy. This yields a novel goodness-of-fit test which outperforms existing methods on high dimensional data. Furthermore, optimizing q(x) to minimize this discrepancy produces a novel method for training unnormalized models. This training method can fit large unnormalized models faster than existing approaches. The ability to both learn and compare models is a unique feature of the proposed method.
The International Conference on Machine Learning (ICML) is the premier gathering of professionals dedicated to the advancement of the branch of artificial intelligence known as machine learning. ICML is globally renowned for presenting and publishing cutting-edge research on all aspects of machine learning used in closely related areas like artificial intelligence, statistics and data science, as well as important application areas such as machine vision, computational biology, speech recognition, and robotics. ICML is one of the fastest growing artificial intelligence conferences in the world. Participants at ICML span a wide range of backgrounds, from academic and industrial researchers, to entrepreneurs and engineers, to graduate students and postdocs.
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